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Atomic-scale EDS Mapping for Chemical Imaging and Quantification of Interdiffusion in Self-assembled Vertically Aligned Nanocomposite Thin Films
Lu, Ping, Romero, Eric, Ihlefeld, Jon, Pan, Wei, Zhang, Wenrui, Wang, Haiyan, Jia, QuanxiVolume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615012027
Date:
August, 2015
File:
PDF, 656 KB
english, 2015