![](/img/cover-not-exists.png)
[IEEE 2017 32nd Youth Academic Annual Conference of Chinese Association of Automation (YAC) - Hefei, China (2017.5.19-2017.5.21)] 2017 32nd Youth Academic Annual Conference of Chinese Association of Automation (YAC) - Intelligent scanning method for UV-FAIMS detection
Liu, Youjiang, Wang, Han, Guan, Ke, Wang, Xiaohua, Li, Shan, Chen, ChilaiYear:
2017
Language:
english
DOI:
10.1109/YAC.2017.7967591
File:
PDF, 356 KB
english, 2017