[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Ultrafast PBTI characterization on Si-free gate last Ge nFETs with stable and ultrathin Al2O3 IL
Joishi, Chandan, Kothari, Shraddha, Ghosh, Sayantan, Mukhopadhyay, Subhadeep, Mahapatra, Souvik, Lodha, SaurabhYear:
2017
Language:
english
DOI:
10.1109/IRPS.2017.7936332
File:
PDF, 796 KB
english, 2017