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An exploration for the degradation behavior of 2-D electrostatic microscanners by accelerated lifetime test
Qiao, Dayong, Zhao, Rong, Zhang, Yalong, Xia, Changfeng, Song, Xiumin, You, QiaomingLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.07.062
Date:
July, 2017
File:
PDF, 3.52 MB
english, 2017