Applied multiresolution analysis to infrared images for...

NDT & E International 2017 / 12 Vol. 92

Applied multiresolution analysis to infrared images for defects detection in materials

Kabouri, Ahmed, Khabbazi, Abdelhamid, Youlal, Hussein
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Volume:
92
Language:
english
Journal:
NDT & E International
DOI:
10.1016/j.ndteint.2017.07.014
Date:
December, 2017
File:
PDF, 1.79 MB
english, 2017
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