![](/img/cover-not-exists.png)
Identification of foreign particles in packages of failed products by application of our modified failure analysis flow
Otte, Rik J., Fonville, Rob F., Knotter, Martin D.Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.07.065
Date:
July, 2017
File:
PDF, 1.72 MB
english, 2017