Scanning focused refractive-index microscopy

Scanning focused refractive-index microscopy

Sun, Teng-Qian, Ye, Qing, Wang, Xiao-Wan, Wang, Jin, Deng, Zhi-Chao, Mei, Jian-Chun, Zhou, Wen-Yuan, Zhang, Chun-Ping, Tian, Jian-Guo
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Volume:
4
Language:
english
Journal:
Scientific Reports
DOI:
10.1038/srep05647
Date:
May, 2015
File:
PDF, 1.94 MB
english, 2015
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