[IEEE 2016 Forum on Specification and Design Languages (FDL) - Bremen, Germany (2016.9.14-2016.9.16)] 2016 Forum on Specification and Design Languages (FDL) - On the application of formal fault localization to automated RTL-to-TLM fault correspondence analysis for fast and accurate VP-based error effect simulation - a case study
Herdt, Vladimir, Le, Hoang M., Grobe, Daniel, Drechsler, RolfYear:
2016
Language:
english
DOI:
10.1109/FDL.2016.7880375
File:
PDF, 281 KB
english, 2016