Wafer-Scale Statistical Analysis of Graphene FETs--Part I: Wafer-Scale Fabrication and Yield Analysis
Smith, Anderson D., Wagner, Stefan, Kataria, Satender, Malm, B. Gunnar, Lemme, Max C., Ostling, MikaelYear:
2017
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2017.2727820
File:
PDF, 4.92 MB
english, 2017