Ellipsometric characterization and optical anisotropy of...

Materials Science in Semiconductor Processing 2017 / 11 Vol. 71

Ellipsometric characterization and optical anisotropy of nanostructured CuIn 3 S 5 and CuIn 5 S 8 thin films

Akkari, F. Chaffar, Abdelkader, D., Gallas, B., Kanzari, M.
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Volume:
71
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2017.07.023
Date:
November, 2017
File:
PDF, 1014 KB
english, 2017
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