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Low Temperature Characterization of Cu-Cu:silica Based Programmable Metallization Cell
Chen, W., Chamele, N., Gonzalez-Velo, Y., Barnaby, H. J., Kozicki, M. N.Year:
2017
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2017.2734743
File:
PDF, 727 KB
english, 2017