Nanoscale observation of organic thin film by atomic force microscopy
Mochizuki, Shota, Uruma, Takeshi, Satoh, Nobuo, Saravanan, Shanmugam, Soga, TetsuoVolume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.08LB08
Date:
August, 2017
File:
PDF, 1.81 MB
english, 2017