Voltage, Throughput, Power, Reliability, and Multicore...

Computer 2017 Vol. 50; Iss. 8

Voltage, Throughput, Power, Reliability, and Multicore Scaling

Xia, Fei, Rafiev, Ashur, Aalsaud, Ali, Al-Hayanni, Mohammed, Davis, James, Levine, Joshua, Mokhov, Andrey, Romanovsky, Alexander, Shafik, Rishad, Yakovlev, Alex, Yang, Sheng
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Volume:
50
Year:
2017
Language:
english
Journal:
Computer
DOI:
10.1109/MC.2017.3001246
File:
PDF, 961 KB
english, 2017
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