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Spectroscopic phonon and extended x-ray absorption fine structure measurements on 3C-SiC/Si (001) epifilms
Talwar, Devki N., Wan, Linyu, Tin, Chin-Che, Lin, Hao-Hsiung, Feng, Zhe ChuanLanguage:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2017.07.266
Date:
July, 2017
File:
PDF, 997 KB
english, 2017