Equalization of multi-Gb/s chip-to-chip interconnects affected by manufacturing tolerances
Bailleul, Jelle, Jacobs, Lennert, Manfredi, Paolo, Vande Ginste, Dries, Moeneclaey, MarcVolume:
62
Language:
english
Journal:
Computers & Electrical Engineering
DOI:
10.1016/j.compeleceng.2017.07.020
Date:
August, 2017
File:
PDF, 1.05 MB
english, 2017