Simulation of the thermal stress induced by CW 1340 nm...

  • Main
  • 2017 / 7
  • Simulation of the thermal stress induced by CW 1340 nm...
Microelectronics Reliability 2017 / 7

Simulation of the thermal stress induced by CW 1340 nm laser on 28 nm advanced technologies

Penzes, M., Dudit, S., Monsieur, F., Silvestri, L., Nallet, F., Lewis, D., Perdu, P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.07.027
Date:
July, 2017
File:
PDF, 1.99 MB
english, 2017
Conversion to is in progress
Conversion to is failed