Influence of cooling rate and annealing on the DSC Tg of an epoxy resin
Tao, Qi, Pinter, Gerald, Krivec, ThomasLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.07.088
Date:
July, 2017
File:
PDF, 1.69 MB
english, 2017