Analysis of the Conduction Mechanism and Copper Vacancy...

Scientific Reports 2017 / 12 Vol. 7; Iss. 1

Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu2O Thin Films

Han, Sanggil, Flewitt, Andrew J.
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Volume:
7
Language:
english
Journal:
Scientific Reports
DOI:
10.1038/s41598-017-05893-x
Date:
December, 2017
File:
PDF, 1.72 MB
english, 2017
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