Measurement of the emission spectrum of a semiconductor...

Scientific Reports 2017 / 12 Vol. 7; Iss. 1

Measurement of the emission spectrum of a semiconductor laser using laser-feedback interferometry

Keeley, James, Freeman, Joshua, Bertling, Karl, Lim, Yah L., Mohandas, Reshma A., Taimre, Thomas, Li, Lianhe H., Indjin, Dragan, Rakić, Aleksandar D., Linfield, Edmund H., Davies, A. Giles, Dean, Paul
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Volume:
7
Language:
english
Journal:
Scientific Reports
DOI:
10.1038/s41598-017-07432-0
Date:
December, 2017
File:
PDF, 2.06 MB
english, 2017
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