[IEEE 2017 12th IEEE International Symposium on Industrial Embedded Systems (SIES) - Toulouse, France (2017.6.14-2017.6.16)] 2017 12th IEEE International Symposium on Industrial Embedded Systems (SIES) - Static probabilistic timing analysis with a permanent fault detection mechanism
Chen, Chao, Panerati, Jacopo, Hafnaoui, Imane, Beltrame, GiovanniYear:
2017
Language:
english
DOI:
10.1109/SIES.2017.7993373
File:
PDF, 779 KB
english, 2017