[IEEE 2017 12th IEEE International Symposium on Industrial...

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[IEEE 2017 12th IEEE International Symposium on Industrial Embedded Systems (SIES) - Toulouse, France (2017.6.14-2017.6.16)] 2017 12th IEEE International Symposium on Industrial Embedded Systems (SIES) - Static probabilistic timing analysis with a permanent fault detection mechanism

Chen, Chao, Panerati, Jacopo, Hafnaoui, Imane, Beltrame, Giovanni
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Year:
2017
Language:
english
DOI:
10.1109/SIES.2017.7993373
File:
PDF, 779 KB
english, 2017
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