Experimental Verification of Degenerate Band Edge...

IEEE Photonics Journal 2016 / 12 Vol. 8; Iss. 6

Experimental Verification of Degenerate Band Edge Dispersion in Silicon Photonic Integrated Circuits

Burr, Justin R., Wood, Michael G., Reano, Ronald M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8
Language:
english
Journal:
IEEE Photonics Journal
DOI:
10.1109/jphot.2016.2633225
Date:
December, 2016
File:
PDF, 960 KB
english, 2016
Conversion to is in progress
Conversion to is failed