Effect of SIMS ionization probability on depth resolution...

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Surface and Interface Analysis 2017 / 06

Effect of SIMS ionization probability on depth resolution for organic/inorganic interfaces

Popczun, Nicholas J., Breuer, Lars, Wucher, Andreas, Winograd, Nicholas
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Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.6246
Date:
June, 2017
File:
PDF, 2.02 MB
english, 2017
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