Admittance Scanning for Whole Column Detection

Admittance Scanning for Whole Column Detection

Stamos, Brian N., Dasgupta, Purnendu K, Ohira, Shin-Ichi
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Volume:
89
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/acs.analchem.7b01412
Date:
July, 2017
File:
PDF, 1.61 MB
english, 2017
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