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[IEEE 2014 International SoC Design Conference (ISOCC) - Jeju (2014.11.3-2014.11.6)] 2014 International SoC Design Conference (ISOCC) - Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE)
Cho, Keewon, Lee, Woosung, Kim, Jooyoung, Kang, SunghoYear:
2014
Language:
english
DOI:
10.1109/isocc.2014.7087606
File:
PDF, 568 KB
english, 2014