Investigating Pb diffusion across buried interfaces in...

  • Main
  • 2017 / 06
  • Investigating Pb diffusion across buried interfaces in...
Surface and Interface Analysis 2017 / 06

Investigating Pb diffusion across buried interfaces in Pb(Zr 0.2 Ti 0.8 )O 3 thin films via time-of-flight secondary ion mass spectrometry depth profiling

Mangum, John S., Podowitz-Thomas, Stephen, Nikkel, Jason, Zhou, Chuanzhen, Jones, Jacob L.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.6255
Date:
June, 2017
File:
PDF, 469 KB
english, 2017
Conversion to is in progress
Conversion to is failed