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The International Journal of Advanced Manufacturing Technology 2017 / 7

Optimal designing of multiple deferred state sampling plan for assuring percentile life under Weibull distribution

Balamurali, S., Jeyadurga, P., Usha, M.
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Language:
english
Journal:
The International Journal of Advanced Manufacturing Technology
DOI:
10.1007/s00170-017-0707-1
Date:
July, 2017
File:
PDF, 548 KB
english, 2017
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