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Hardness of k-LWE and Applications in Traitor Tracing
Ling, San, Phan, Duong Hieu, Stehlé, Damien, Steinfeld, RonLanguage:
english
Journal:
Algorithmica
DOI:
10.1007/s00453-016-0251-7
Date:
November, 2016
File:
PDF, 724 KB
english, 2016