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Development and testing of an active high voltage saturation probe for characterization of ultra-high voltage silicon carbide semiconductor devices
Bilbao, Argenis V., Schrock, James A., Ray, William B., Kelley, Mitchell D., Holt, Shad L., Giesselmann, Michael G., Bayne, Stephen B.Volume:
86
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4927822
Date:
August, 2015
File:
PDF, 983 KB
english, 2015