[IEEE 2017 International Mixed Signals Testing Workshop...

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[IEEE 2017 International Mixed Signals Testing Workshop (IMSTW) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 International Mixed Signals Testing Workshop (IMSTW) - Analytical study of on-chip generations of analog sine-wave based on combined digital signals

David-Grignot, Stephane, Lamlih, Achraf, Kerzerho, Vincent, Azaıs, Florence, Soulier, Fabien, Bernard, Serge, Rouyer, Tristan, Bonhommeau, Sylvain
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Year:
2017
Language:
english
DOI:
10.1109/IMS3TW.2017.7995205
File:
PDF, 651 KB
english, 2017
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