[IEEE 2017 International Mixed Signals Testing Workshop (IMSTW) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 International Mixed Signals Testing Workshop (IMSTW) - Analytical study of on-chip generations of analog sine-wave based on combined digital signals
David-Grignot, Stephane, Lamlih, Achraf, Kerzerho, Vincent, Azaıs, Florence, Soulier, Fabien, Bernard, Serge, Rouyer, Tristan, Bonhommeau, SylvainYear:
2017
Language:
english
DOI:
10.1109/IMS3TW.2017.7995205
File:
PDF, 651 KB
english, 2017