Global sensitivity analysis for repeated measures studies...

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Biometrics 2017 / 05

Global sensitivity analysis for repeated measures studies with informative drop-out: A semi-parametric approach

Scharfstein, Daniel, McDermott, Aidan, Díaz, Iván, Carone, Marco, Lunardon, Nicola, Turkoz, Ibrahim
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Language:
english
Journal:
Biometrics
DOI:
10.1111/biom.12729
Date:
May, 2017
File:
PDF, 459 KB
english, 2017
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