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[ACM Press the 23rd ACM SIGKDD International Conference - Halifax, NS, Canada (2017.08.13-2017.08.17)] Proceedings of the 23rd ACM SIGKDD International Conference on Knowledge Discovery and Data Mining - KDD '17 - Scalable Top-n Local Outlier Detection
Yan, Yizhou, Cao, Lei, Rundensteiner, Elke A.Year:
2017
Language:
english
DOI:
10.1145/3097983.3098191
File:
PDF, 1.58 MB
english, 2017