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System-Level Analysis of the Vulnerability of Processors Exposed to Single Event Upsets via Probabilistic Model Checking
Ammar, Marwan, Hamad, Ghaith Bany, Mohamed, Otmane Ait, Savaria, YvonYear:
2017
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2017.2736061
File:
PDF, 1.05 MB
english, 2017