[IEEE 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2017.5.30-2017.6.2)] 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - New Method to Separate Failure Modes by Transient Thermal Analysis of High Power LEDs
Hanss, Alexander, Liu, E., Schmid, Maximilian, Muller, Dominik, Karbowski, Udo, Derix, Robert, Elger, GordonYear:
2017
Language:
english
DOI:
10.1109/ectc.2017.137
File:
PDF, 1.23 MB
english, 2017