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[ACM Press the 6th International Workshop - Vienna, Austria (2016.10.28-2016.10.28)] Proceedings of the 6th International Workshop on Trustworthy Embedded Devices - TrustED '16 - Online Reliability Testing for PUF Key Derivation
Hiller, Matthias, Önalan, Aysun Gurur, Sigl, Georg, Bossert, MartinYear:
2016
Language:
english
DOI:
10.1145/2995289.2995293
File:
PDF, 624 KB
english, 2016