Correlating the silicon surface passivation to the nanostructure of low-temperature a-Si:H after rapid thermal annealing
Macco, Bart, Melskens, Jimmy, Podraza, Nikolas J., Arts, Karsten, Pugh, Christopher, Thomas, Owain, Kessels, Wilhelmus M. M.Volume:
122
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4994795
Date:
July, 2017
File:
PDF, 1.48 MB
english, 2017