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SPIE Proceedings [SPIE Fifth International Conference on Optical and Photonics Engineering - Singapore, Singapore (Tuesday 4 April 2017)] Fifth International Conference on Optical and Photonics Engineering - Snapshot hyperspectral imaging probe with principal component analysis and confidence ellipse for classification
Asundi, Anand K., Lim, Hoong-Ta, Vadakke Matham, MurukeshanVolume:
10449
Year:
2017
Language:
english
DOI:
10.1117/12.2270736
File:
PDF, 440 KB
english, 2017