Empirical Bayes Estimates of Development Reliability for...

Safety and Reliability 2009 / 12 Vol. 29; Iss. 4

Empirical Bayes Estimates of Development Reliability for One Shot Devices

Quigley, John, Bedford, Tim, Walls, Lesley
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Volume:
29
Language:
english
Journal:
Safety and Reliability
DOI:
10.1080/09617353.2009.11690888
Date:
December, 2009
File:
PDF, 706 KB
english, 2009
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