TENTATIVE FOR TRACE ELEMENTS EVALUATION BY PIXE METHOD...

Journal of Trace and Microprobe Techniques 2002 / 01 Vol. 20; Iss. 4

TENTATIVE FOR TRACE ELEMENTS EVALUATION BY PIXE METHOD VERSUS DEPTH IN SOFT TISSUES NEAR METALLIC IMPLANTS

Chassot, E., Oudadesse, H., Barbotteau, Y., Irigaray, J. L., Terver, S., Vanneuville, G., Moretto, Ph.
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Volume:
20
Language:
english
Journal:
Journal of Trace and Microprobe Techniques
DOI:
10.1081/tma-120015618
Date:
January, 2002
File:
PDF, 491 KB
english, 2002
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