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SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2016 - Beijing, China (Monday 9 May 2016)] Optical Measurement Technology and Instrumentation - Extrinsic Fabry-Perot interferometric sensor using a polarization-switched phase interrogator
Xia, Ji, Han, Sen, Tan, JiuBin, Wang, Fuyin, Yang, Yangyang, Xiong, Shuidong, Luo, Hong, Wei, WenjianVolume:
10155
Year:
2016
Language:
english
DOI:
10.1117/12.2247310
File:
PDF, 686 KB
english, 2016