[IEEE 2017 75th Device Research Conference (DRC) - South...

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[IEEE 2017 75th Device Research Conference (DRC) - South Bend, IN, USA (2017.6.25-2017.6.28)] 2017 75th Annual Device Research Conference (DRC) - Reconfigurable germanium transistors with low source-drain leakage for secure and energy-efficient doping-free complementary circuits

Trommer, J., Heinzig, A., Slesazeck, S., Muhle, U., Loffler, M., Walter, D., Mayr, C., Mikolajick, T., Weber, W. M.
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Year:
2017
Language:
english
DOI:
10.1109/DRC.2017.7999426
File:
PDF, 1.11 MB
english, 2017
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