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[IEEE 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2017.5.30-2017.6.2)] 2017 IEEE 67th Electronic Components and Technology Conference (ECTC) - Effect of Mean Temperature on the Evolution of Strain-Amplitude in SAC Ball-Grid Arrays during Operation under Thermal Aging and Temperature Excursions
Lall, Pradeep, Mirza, Kazi, Suhling, Jeff, Locker, DavidYear:
2017
DOI:
10.1109/ECTC.2017.299
File:
PDF, 5.33 MB
2017