Local Dielectric Breakdown Path along c -Axis Planar Boundaries in Cr 2 O 3 Thin Films
Sun, Congli, Song, Zhewen, Rath, Ashutosh, Street, Michael, Echtenkamp, William, Feng, Jie, Binek, Christian, Morgan, Dane, Voyles, PaulLanguage:
english
Journal:
Advanced Materials Interfaces
DOI:
10.1002/admi.201700172
Date:
August, 2017
File:
PDF, 2.06 MB
english, 2017