[IEEE 2017 40th International Spring Seminar on Electronics Technology (ISSE) - Sofia, Bulgaria (2017.5.10-2017.5.14)] 2017 40th International Spring Seminar on Electronics Technology (ISSE) - Analysis of IC's electromagnetic field print throughout a decapsulation procedure
Safta, Mariana, Svasta, Paul Mugur, Vasile, Daniel-Ciprian, Dima, Mihai-OctavianYear:
2017
Language:
english
DOI:
10.1109/ISSE.2017.8000973
File:
PDF, 1.72 MB
english, 2017