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[IEEE 2017 89th ARFTG Microwave Measurement Conference (ARFTG) - Honololu, HI, USA (2017.6.9-2017.6.9)] 2017 89th ARFTG Microwave Measurement Conference (ARFTG) - Pad-open-short de-embedding method extended for 3-port devices and non-ideal standards
Khelifi, W., Reveyrand, T., Lintignat, J., Jarry, B., Quere, R., Lapierre, L., Armengaud, V., Langrez, D.Year:
2017
Language:
english
DOI:
10.1109/ARFTG.2017.8000844
File:
PDF, 1.03 MB
english, 2017