[IEEE 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) - Saint Petersburg, Russia (2017.5.24-2017.5.26)] 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) - Rapid prototyping of face retrieval systems in Simulink
Petrova, Varvara A., Shchegoleva, Nadezhda L.Year:
2017
Language:
english
DOI:
10.1109/scm.2017.7970571
File:
PDF, 216 KB
english, 2017