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[IEEE 2017 Symposium on VLSI Technology - Kyoto, Japan (2017.6.5-2017.6.8)] 2017 Symposium on VLSI Technology - High-speed and logic-compatible split-gate embedded flash on 28-nm low-power HKMG logic process
Lee, Yong Kyu, Jeon, Changmin, Min, Hongkook, Seo, Boyoung, Kim, Kwangtae, Kim, Donghyun, Min, Kyungsoo, Woo, JongSung, Kang, Hyunug, Chung, YongSeok, Kim, Minsu, Jang, Jaejune, Yeom, KyongSik, Kim, JYear:
2017
Language:
english
DOI:
10.23919/VLSIT.2017.7998171
File:
PDF, 872 KB
english, 2017