STEM-EELS Investigation of Charge and Strain Distributions...

Microscopy and Microanalysis 2017 / 07 Vol. 23; Iss. S1

STEM-EELS Investigation of Charge and Strain Distributions in Perovskite Oxide Thin Films

Li, X., Tied, G., Marinova, M., Preziosi, D., Garcia, V., Fusil, S., Barthelemy, A., Bibes, M., Torres-Pardo, A., Fowlie, J., Gibert, M., Catalano, S., Gariglio, S., Triscone, J.M., Zobelli, A., Tence
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927617008716
Date:
July, 2017
File:
PDF, 916 KB
english, 2017
Conversion to is in progress
Conversion to is failed