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SPIE Proceedings [SPIE Substance Identification Technologies - Innsbruck, Austria (Sunday 3 October 1993)] Substance Detection Systems - X-ray and gamma-ray computed tomography for industrial nondestructive testing and evaluation
Costello, Ian, Wells, Peter, Davis, John R., Benci, Nino, Skerrett, David, Davies, D. R., Harding, Geoffrey L., Lanza, Richard C., Myers, Lawrence J., Young, Peter A.Volume:
2092
Year:
1994
Language:
english
DOI:
10.1117/12.171265
File:
PDF, 581 KB
english, 1994