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Structural and optical characterization of GaAs and InGaAs thin films deposited by RF magnetron sputtering
Bernal-Correa, R., Hernández, S. Gallardo, Cardona-Bedoya, J., Pulzara-Mora, A.Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2017.08.042
Date:
August, 2017
File:
PDF, 1.34 MB
english, 2017