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Understanding and Exploiting the Interaction of Electron Beams With Low-dimensional Materials - From Controlled Atomic-level Manipulation to Circumventing Radiation Damage
Susi, T., Mittelberger, A., Kramberger, C., Mangier, C., Hofer, C., Pennycook, T.J., Kotakoski, J., Meyer, J. C.Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927617001660
Date:
July, 2017
File:
PDF, 2.86 MB
english, 2017